Some results of simulation by the program ModeRTL for 5 MeV electron beam
Figures 1a and 2b represent some results of the depthdose distribution within the sample of polymer composite materials (PCM) calculated by Monte Carlo method at one and double treatment of the irradiated materials from opposite sides.
Irradiated target is compound (wood of aspen + 70% polymethylmethacrylate, PMMA) with density 0.8 g/cm3.
Triangular scanning.
Electron energy  5 MeV.
Average beam current  1 mA.
Thickness  5.65 cm.
Statistical deviation 0.25% for center and 2.6% for boundary, running time less than 3 minutes on PC AMDK7, 750 MHz .
Figure 1a and b. 2Dview of the depthdose distribution in the sample of PCM.
One and twosided irradiation.
Figure 2a and b. 3Dview of the EB dose mapping within compound at onesided irradiation (a) and for optimal targets thickness at doublesided irradiation (b).
3Dview of the depthdose distributions near the boundary of wooden block with air at various inclination angles β of the target are presented in Figs. 3(a) and (b): β = 0 degree (Fig. 3(a)) and β = 3 degree (Fig. 3(b)). Wooden block is irradiated by scanning electron beam at doublesided.
Figs. 3(a) and (b). 3Dview of the depthdose distribution near the boundary of wooden block with air at different inclination angles β of the target: β = 0 degree (Fig. 3(a)) and β = 3 degree (Fig. 3(b)).
The compare results for EB depthdose distributions in a plane, which cross the center (curves 1 and 2) in the direction of moving conveyer, and the boundaries (curve 3) of an irradiated target at the end of scan beam direction (see Fig. 4 (b)) at doublesided irradiation are shown in Fig. 4 (a).
Curves 2 and 3 simulated by MC method, curve 1  by Analytical method.
As is seen from Fig. 4 (a), the good agreement between depthdose distributions in a plane, which cross the center calculated by Analytical method (curves 1) and simulated by MC method (curve 2) is observed. It allows to use Analytical method for fast optimization of irradiation regimes and integrate it in control system of radiation facility.
The simulation results by MC method of the charge deposition in the center and the boundaries of compound irradiated by 5 MeV electron beam are presented in Fig. 4(b).
Figure 4 a and b. The compare results for EB depthdose distributions in a plane, which cross the center (curves 1, 2) in the direction of moving conveyer, and the boundaries (curve 3) of an irradiated target at the end of scan beam direction at doublesided irradiation (a).
Charge deposition in PE target irradiated with scanned EB
2Dview (left) for charge depositions in the center (green curve) and the boundaries (blue curve) of PE target irradiated with scanned 2 MeV electron beam. 3Dview (right) for charge depositions in PE target. Target depth 1.2 cm (axis X), target width 10 cm (axis Y), width of scanning 1cm (axis Y).
Point Beam 
Oneside Irradiation 
SOURCE 
2D Temperature
Point Beam 

Point Beam 

Point Beam 